Sunday - May 22
6:00
PM -
Reception & Registration.
7:30 PM - Panel Session - Spray
Characterization: Techniques, Capabilities, Limitations,
Accuracy, and Error Analysis
Jim
Drallmeier, University of Missouri, Rolla
William D. Bachalo, Artium Technologies, Inc.
Henrik G. Krarup, Malvern Instruments, Inc.
Jongmook Lim, En’Urga
9:00 PM -
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